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döl vakum Margaret Mitchell gabor gyepes sram reliability balta yargı Güle güle

An embedded IDDQ testing circuit and technique | Semantic Scholar
An embedded IDDQ testing circuit and technique | Semantic Scholar

PDF) Internal Write-Back and Read-Before-Write Schemes to Eliminate the  Disturbance to the Half-Selected Cells in SRAMs
PDF) Internal Write-Back and Read-Before-Write Schemes to Eliminate the Disturbance to the Half-Selected Cells in SRAMs

IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC  SUPPLY CURRENT
IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT

An embedded IDDQ testing circuit and technique | Semantic Scholar
An embedded IDDQ testing circuit and technique | Semantic Scholar

Waveforms of simulations (defect 4) | Download Scientific Diagram
Waveforms of simulations (defect 4) | Download Scientific Diagram

Fault detection as a function of the cycle time, defect size and number...  | Download Scientific Diagram
Fault detection as a function of the cycle time, defect size and number... | Download Scientific Diagram

PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION  OF WEAK OPENS | Semantic Scholar
PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar

Waveforms of simulations (defect 4) | Download Scientific Diagram
Waveforms of simulations (defect 4) | Download Scientific Diagram

IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC  SUPPLY CURRENT
IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT

dblp: Gábor Gyepes
dblp: Gábor Gyepes

Waveforms of simulations (defect 4) | Download Scientific Diagram
Waveforms of simulations (defect 4) | Download Scientific Diagram

IEEE Paper Template in A4 (V1)
IEEE Paper Template in A4 (V1)

PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION  OF WEAK OPENS | Semantic Scholar
PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar

Waveforms of simulations (defect 4) | Download Scientific Diagram
Waveforms of simulations (defect 4) | Download Scientific Diagram

IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC  SUPPLY CURRENT
IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT

PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION  OF WEAK OPENS | Semantic Scholar
PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar

Defect positions of 1-bit ripple carry adder | Download Scientific Diagram
Defect positions of 1-bit ripple carry adder | Download Scientific Diagram

PDF) IOSR journal of VLSI and Signal Processing | IOSR Journals -  Academia.edu
PDF) IOSR journal of VLSI and Signal Processing | IOSR Journals - Academia.edu

PDF) Dynamic power supply current test for CMOS SRAM
PDF) Dynamic power supply current test for CMOS SRAM

Ľudia na STU - Ing. Gábor Gyepes, PhD.
Ľudia na STU - Ing. Gábor Gyepes, PhD.

IEEE Paper Template in A4 (V1)
IEEE Paper Template in A4 (V1)

An embedded IDDQ testing circuit and technique | Semantic Scholar
An embedded IDDQ testing circuit and technique | Semantic Scholar

IEEE Paper Template in A4 (V1)
IEEE Paper Template in A4 (V1)

Waveforms of simulations (defect 2) | Download Scientific Diagram
Waveforms of simulations (defect 2) | Download Scientific Diagram

2011 IEEE 14th International Symposium on Design and Diagnostics of  Electronic Circuits & Systems (DDECS 2011) : Cottbus
2011 IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2011) : Cottbus

IEEE Paper Template in A4 (V1)
IEEE Paper Template in A4 (V1)